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Abolute Reflectance MeasurementJASCO is a leading manfacturer of reflectance measurement systems resulting from collaborations with many leading film and semi-conductor manufacturers. Three instruments include
The absolute reflectance measurement system performs the measurement of spectral properties for film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements.
Synchronous Absolute Reflectance Accessory Manual OperationThe Models ARV-730/ARN-731 are designed to measure the absolute reflectance of a specularly reflecting sample and the relative reflectance of a diffuse reflecting sample. It also permits the measurement of transmittance by using an optional solid sample holder for transmittance measurement. ARV-730 Absolute reflectance measurement accessory for V-650/660 (UV-Vis, Synchronous)
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Wavelength range |
250 - 850 nm (Model ARV-730) |
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250 - 2000 nm (Model ARN-731) |
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Angle of incidence Absolute reflectance measurement: |
5- 60deg. |
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Relative reflectance measurement: |
Vertical incidence |
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Sample size - Absolute reflectance measuring holder |
Minimum 20 mm (height) deg. 20 mm (width) deg. 1 mm (depth) |
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Maximum 70 mm (height) deg. 100 mm (width) deg. 10 mm (depth) |
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Sample Size - Relative reflectance measuring holder |
Minimum 20 mm (height) deg. 20 mm (width) deg. 0.5 mm (depth) |
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Maximum 70 mm (height) deg. 100 mm (width) deg. 10 mm (depth) |
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Light beam - Position of absolute reflectance measuring window |
10 mm (height) deg. 3 mm (width) |
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Light beam - Position of relative reflectance measuring window |
10 mm (height) deg. 3 mm (width) |
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Detector |
60 mm-dia. integrating sphere |
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Photomultiplier tube (Model ARV-730/ARN-731) |
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PbS photoconductive cell (Model ARN-731) |
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Bandwidth |
UV: 5 nm |
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NIR: 20 nm |
Asynchronous Absolute Reflectance Measurement Manual Operation
The Model ARSV-732/ARSN-733 manual stage for measuring the absolute reflectance and transmittance of a sample that does not diffuse light. The detector is equipped with an integrating sphere and thus it also permits measurement of the relative reflectance and transmittance of samples that do diffuse light (the sample holder for measurement of relative reflectance is standard, but the sample holder for measurement of transmittance is an option).
Absolute reflectance and transmittance are measured by rotating the sample stage to determine the angle of the light incident upon the sample and independently setting the detector in the path of the reflected light or the transmitted light through the sample. The relative reflectance is measured with light normally incident on the sample, which is set behind the integrating sphere.
ARSV-732 Absolute reflectance measurement accessory for V-650/660 (UV-Vis, Asynchronous)
ARSN-733 Absolute reflectance measurement accessory for V-670 (UV-Vis/NIR, Asynchronous)
Specifications
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Wavelength range |
250 - 850 nm (Model ARSV-732) |
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250 - 2000 nm (Model ARSN-733) |
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Angle of incidence |
Absolute reflectance measurement: 5 - 60deg. |
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Transmittance measurement: 0 - 60deg. |
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Relative reflectance measurement: Vertical incidence |
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Setting of angle of incidence |
Sample stage: 0.1deg. |
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Sample size |
Absolute reflectance measuring holder |
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Minimum 20 mm (height) x 20 mm (width) x 1 mm (depth) |
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Maximum 70 mm (height) x 100 mm (width) x 10 mm (depth) |
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Relative reflectance measuring holder |
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Minimum 20 mm (height) x 20 mm (width) x 0.5 mm (depth) |
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Maximum 70 mm (height) x 100 mm (width) x 10 mm (depth) |
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Light beam |
Position of absolute reflectance measuring window - Various |
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Detector |
60 mm-dia. integrating sphere |
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Photomultiplier tube (Model ARSV-732/ARSN-733) |
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PbS photoconductive cell (Model ARSN-733) |
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Bandwidth |
UV: 5 nm NIR: 20 nm |
Asynchronous Absolute Reflectance Measurement Automatic Operation
The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements. Coupled with the JASCO V-Series UV-Vis/NIR Spectrophotometers, the instrument provides measurements of challenging samples with dramatically reduced noise and excellent photometric stability. The incidence and collection angles can be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can also be examined using P or S polarization or by setting the desired polarization angles.
ARMV-734 Automated absolute reflectance measurement accessory for V650/660 (UV/VIS)
ARMN-735 Automated absolute reflectance measurement accessory for V670 (UV/VIS/NIR)
Optional Accessories
ARG-476/GPH-506 Polarizer (Glan-Taylor prism)
Light from a spectrophotometer that employs a grating is always polarized. The ratio of the intensities of the S polarized light and the P polarized light varies according to the wavelength and also differs from one grating to another for the same wavelength. The greater the angle of incidence of the beam on the sample, the greater the difference in the intensity of the S polarized reflected light and the P polarized reflected light, making measurement inaccurate if the absolute reflectance is measured at a high angle of incidence. In such a case, the polarizer can be set to 45 degrees so that the incident light can be considered non-polarized.
A polarizer is required to accurately measure the absolute reflectance when the angle of incidence of 30 deg. or greater.
SSH-508 Solid Sample Holder
This attachment is used to measure the transmittance of a sample that diffuses light
